On Friday 2nd and Saturday 3rd June, the Fashion Department of the Royal Academy of Fine Arts in Antwerp is presenting its annual runway show SHOW2017. During the show, first years to Masters’ students will debut their designs. This is a tradition that is followed by more than 4.000 fashion enthousiasts, journalists and professionals from all over the world. Which is no surprise, concidering the Antwerp fashion Academy is currently rated by BOF as the 3rd best fashion design school in the world.

The Jury

Moments ago, the Antwerp Fashion Department announced the jury of this years show. The academy always makes sure to include some of the world’s most respected professionals out of the fashion and art scene into the jury. This year is no exception to the rule.

The jury of SHOW2017 include people like Stromae, Glenn Marten (designer of Y/Project), the editor in chief of DUST Magazine and more.  There’s also Patrick Scallon from the Dries Van Noten-team who is joining. Famous Antwerp-based streetwear store ‘VIER‘ also has its co-owner, Giancarlo Angeletti, in the jury of the fashion academy. Full list below.

ENFNTS TERRIBLES will be present at the show to give you a front row look at this year’s graduates. We’re also able to give you an exclusive backstage look on instagram and instagram stories, thanks to MAC Cosmetics. Make sure to follow us on INSTAGRAM for the full report.

Here’s the full line-up of this year’s jury for the annual Antwerp fashion academy show:

ANJA ARONOWSKY CRONBERG – Editor-in-chief Vestoj, London
LUCA GUARINI – Editor-in-chief DUST Magazine, Berlin/London
STROMAE & CORALIE BARBIER – Designers Mosaert, Brussels
AXEL KELLER – Consultant, Paris
COCO CAPITAN – Artist, London
ELISA PALOMINO – Designer and teacher BA CSM, London
SOFIE VAN DE VELDE – Owner Gallery Sofie Van de Velde, Antwerp
GLENN MARTENS – Designer Y/Project, Paris
ELISABETH CLAUSS – Fashion writer, Brussels
JOHN DE GREEF – Fashion director Elsevier ST L, Amsterdam
PATRICK SCALLON – Director communications Dries Van Noten, Paris